Electronics assembly A1
Power supply card A1A1
Control logic card A1A2
Transceiver assembly A2
Optical bench assembly A2A1
Receiver card A2A4
Protect these units and cards by wearing a grounding
wristband while probing. Handling and/or installation
of individual cards should be performed at a static-
free work station.
These units and cards should be
anti-static packaged during handling and storage.
Do not allow the laser to fire for more than 2
minutes. After firing in the DES mode, allow laser to
cool for 30 seconds before proceeding.
You must perform the PFN V DC adjustment described in part B
whenever the transceiver assembly A2 or the power supply card A1A1
Signal names and test point nomenclature are given in all capital
As you read earlier, this lesson includes only the test sequences and
troubleshooting tables for the low voltage power test and the receiver test
(see appendix B). The TM uses the same format and organization for each of
the 12 tests.
Below is a brief description of the format and procedures
used throughout TM 9-1260-477-34-2. For each test procedure, you will note
the following columnar format.
The LOCATION column at the extreme right margin
component/equipment where you perform the ACTION.